Micro-Raman studies on thermally evaporated Ag2Se thin films
الموضوعات : Journal of Theoretical and Applied Physics
Mariappan Pandiaraman
1
(Department of Physics, Sethu Institute of Technology)
Natarajan Soundararajan
2
(Thin film Lab, School of Physics, Madurai Kamaraj University)
الکلمات المفتاحية: Micro, Raman, Thin films, XRD, Optical studies,
ملخص المقالة :
AbstractSilver selenide (Ag2Se) thin films of thickness between 80 and 160 nm were prepared by thermal evaporation method. From XRD studies, the structure of the prepared film is confirmed to exhibit orthorhombic structure with polycrystalline nature. The average grain size of Ag2Se has been determined as 43 nm. EDAX spectra of these films were taken, and its composition ratio has been analyzed. Micro-Raman spectra of bulk and their films have been recorded with He-Ne laser source at room temperature. Raman peaks are observed at 232, 455, 566 and 815 cm−1. These peaks are assigned to their corresponding modes of vibrations.
