Production and investigation about nano structures of heterogeneous ZnS/glass thin layer‎

الموضوعات : مجله بین المللی ریاضیات صنعتی

H. Kangarlou ¹ (Department of Mathematics, Urmia Branch, Islamic Azad University, Urmia, Iran.)

تاريخ الإرسال : 15 الأربعاء , ربيع الثاني, 1436 تاريخ التأكيد : 15 الأربعاء , ربيع الثاني, 1436 تاريخ الإصدار : 10 الخميس , ربيع الأول, 1436

الکلمات المفتاحية: AFM, XRD, nanostructure‎‎‎,

ملخص المقالة :

ZnS/glass Thinlayer in high vacuum condition and $40$ degree‎ ‎Deposition angle has been produced by resistance evaporated method ‎with $28$ nm thickness‎. ‎cabin deposition temperature ZnS layer was‎ ‎about $50C$ and substrates were kept at room temperature‎. ‎The Atomic ‎Force Microscopy (AFM) and XRD analyses are perfectly accomplished‎ ‎for this layer.‎‎‎