Influence analysis of dielectric pocket on ambipolar behavior and high-frequency performance of dual material gate oxide stack -double gate Nano-Scale TFET

Subject Areas : Journal of Nanoanalysis

Melisa Ebrahimnia ¹ , Seyed Ali Sedigh Ziabari ² , Azadeh Kiani-sarkaleh ³

1 - Department of Electrical Engineering, Rasht Branch, Islamic Azad University, Rasht, Iran.
2 - Department of Electrical Engineering, Rasht Branch, Islamic Azad University, Rasht, Iran
3 - Department of Electrical Engineering, Energy and Building Research Center, Rasht Branch, Islamic Azad University, Rasht, Iran.

Received: 2021-10-29 Accepted : 2022-03-30 Published : 2022-04-01

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