Estimation of lattice strain in alumina–zirconia nanocomposites by X-ray diffraction peak profile analysis
محورهای موضوعی : Journal of Theoretical and Applied Physics
Apurba Kanti Deb
1
,
Partha Chatterjee
2
1 - Department of Physics, Raiganj University
2 - Department of Physics, Vivekananda Mahavidyalaya
کلید واژه: α, AlO–ZrO nanocomposite, x, ray line profile analysis, Microstructure, Rietveld refinement,
چکیده مقاله :
AbstractZirconia nanoparticles were synthesized by a solution combustion technique. Zirconia nanoparticles were grown inside alumina templates to control the crystal size. The alumina templates were characterized by pores of sizes of approximately 6–8 nm. X-ray diffraction line profile analysis using Williamson–Hall method and Warren and Averbach revealed that the alumina templates were characterized by negligible defect-related effect of lattice distortion. Rietveld structure refinement did not reveal any gross difference with the literature reported values for cell parameters ‘a’ and ‘c’ and fractional atomic coordinates x and z for Al and O atoms indicating no large-scale bond deformation. The template X-ray reflections in the nanocomposites are skewed in nature which indicates some distortion of the templates might have taken place. The distortion is, however, plastic in nature which is evident from the higher level of lattice distortion viz. 0.2% of lattice microstrain.
